Reproducing the 'Framing' by a Sequential Stress Test

David Miller; Michael Kempe; Michael Owen-Bellini; Peter Hacke; Tadanori Tanahashi; Keiichiro Sakurai; Tsuyoshi Shioda; William Gambogi; Nancy Phillips; Kaushik Choudhury; Sergiu Spataru

doi:10.1109/PVSC40753.2019.8980920

Reproducing the 'Framing' by a Sequential Stress Test

David Miller, Michael Kempe, Michael Owen-Bellini, Peter Hacke, Tadanori Tanahashi, Keiichiro Sakurai, Tsuyoshi Shioda, William Gambogi, Nancy Phillips, Kaushik Choudhury, Sergiu Spataru

Materials Science

Research output: Contribution to conference › Paper › peer-review

2 Scopus Citations

Abstract

The "Framing" (local discoloration along cell edges) was induced by a simple sequential accelerated stress test (consisting of hygrothermal- and UV-stressors) applied to the PV modules with high OTR (oxygen transmission rate) backsheet, irrespective of the inclusion of UV-absorber in poly(ethylene-co-vinyl acetate) (EVA) encapsulant. UV-fluorescence imaging of the PV modules suggests that the spatially-inhomogeneous degradation of EVA material under UV-irradiating conditions is correlated to this "Framing" indicating an underlying common mechanism. These findings would contribute to the development of test procedures to broadly mimic the actual failures observed in fielded PV.

Original language	American English
Pages	1403-1409
Number of pages	7
DOIs	https://doi.org/10.1109/PVSC40753.2019.8980920 https://doi.org/10.1109/PVSC40753.2019.8980920
State	Published - Jun 2019
Event	46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States Duration: 16 Jun 2019 → 21 Jun 2019

Conference

Conference	46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/Territory	United States
City	Chicago
Period	16/06/19 → 21/06/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

NREL Publication Number

NREL/CP-5K00-76346

Keywords

framing
metallization
photovoltaic (PV) module
snail trail
ultraviolet (UV)-induced degradation

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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Miller, D., Kempe, M., Owen-Bellini, M., Hacke, P., Tanahashi, T., Sakurai, K., Shioda, T., Gambogi, W., Phillips, N., Choudhury, K., & Spataru, S. (2019). Reproducing the 'Framing' by a Sequential Stress Test. 1403-1409. Paper presented at 46th IEEE Photovoltaic Specialists Conference, PVSC 2019, Chicago, United States. https://doi.org/10.1109/PVSC40753.2019.8980920, https://doi.org/10.1109/PVSC40753.2019.8980920

@conference{cf5a19b401a147b4b58592d2a7cb5e47,

title = "Reproducing the 'Framing' by a Sequential Stress Test",

abstract = "The {"}Framing{"} (local discoloration along cell edges) was induced by a simple sequential accelerated stress test (consisting of hygrothermal- and UV-stressors) applied to the PV modules with high OTR (oxygen transmission rate) backsheet, irrespective of the inclusion of UV-absorber in poly(ethylene-co-vinyl acetate) (EVA) encapsulant. UV-fluorescence imaging of the PV modules suggests that the spatially-inhomogeneous degradation of EVA material under UV-irradiating conditions is correlated to this {"}Framing{"} indicating an underlying common mechanism. These findings would contribute to the development of test procedures to broadly mimic the actual failures observed in fielded PV.",

keywords = "framing, metallization, photovoltaic (PV) module, snail trail, ultraviolet (UV)-induced degradation",

author = "David Miller and Michael Kempe and Michael Owen-Bellini and Peter Hacke and Tadanori Tanahashi and Keiichiro Sakurai and Tsuyoshi Shioda and William Gambogi and Nancy Phillips and Kaushik Choudhury and Sergiu Spataru",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 ; Conference date: 16-06-2019 Through 21-06-2019",

year = "2019",

month = jun,

doi = "10.1109/PVSC40753.2019.8980920",

language = "American English",

pages = "1403--1409",

}

Miller, D , Kempe, M , Owen-Bellini, M , Hacke, P, Tanahashi, T, Sakurai, K, Shioda, T, Gambogi, W, Phillips, N, Choudhury, K & Spataru, S 2019, 'Reproducing the 'Framing' by a Sequential Stress Test', Paper presented at 46th IEEE Photovoltaic Specialists Conference, PVSC 2019, Chicago, United States, 16/06/19 - 21/06/19 pp. 1403-1409. https://doi.org/10.1109/PVSC40753.2019.8980920, https://doi.org/10.1109/PVSC40753.2019.8980920

TY - CONF

T1 - Reproducing the 'Framing' by a Sequential Stress Test

AU - Miller, David

AU - Kempe, Michael

AU - Owen-Bellini, Michael

AU - Hacke, Peter

AU - Tanahashi, Tadanori

AU - Sakurai, Keiichiro

AU - Shioda, Tsuyoshi

AU - Gambogi, William

AU - Phillips, Nancy

AU - Choudhury, Kaushik

AU - Spataru, Sergiu

PY - 2019/6

Y1 - 2019/6

N2 - The "Framing" (local discoloration along cell edges) was induced by a simple sequential accelerated stress test (consisting of hygrothermal- and UV-stressors) applied to the PV modules with high OTR (oxygen transmission rate) backsheet, irrespective of the inclusion of UV-absorber in poly(ethylene-co-vinyl acetate) (EVA) encapsulant. UV-fluorescence imaging of the PV modules suggests that the spatially-inhomogeneous degradation of EVA material under UV-irradiating conditions is correlated to this "Framing" indicating an underlying common mechanism. These findings would contribute to the development of test procedures to broadly mimic the actual failures observed in fielded PV.

AB - The "Framing" (local discoloration along cell edges) was induced by a simple sequential accelerated stress test (consisting of hygrothermal- and UV-stressors) applied to the PV modules with high OTR (oxygen transmission rate) backsheet, irrespective of the inclusion of UV-absorber in poly(ethylene-co-vinyl acetate) (EVA) encapsulant. UV-fluorescence imaging of the PV modules suggests that the spatially-inhomogeneous degradation of EVA material under UV-irradiating conditions is correlated to this "Framing" indicating an underlying common mechanism. These findings would contribute to the development of test procedures to broadly mimic the actual failures observed in fielded PV.

KW - framing

KW - metallization

KW - photovoltaic (PV) module

KW - snail trail

KW - ultraviolet (UV)-induced degradation

UR - http://www.scopus.com/inward/record.url?scp=85081535328&partnerID=8YFLogxK

U2 - 10.1109/PVSC40753.2019.8980920

DO - 10.1109/PVSC40753.2019.8980920

M3 - Paper

AN - SCOPUS:85081535328

SP - 1403

EP - 1409

T2 - 46th IEEE Photovoltaic Specialists Conference, PVSC 2019

Y2 - 16 June 2019 through 21 June 2019

ER -

Reproducing the 'Framing' by a Sequential Stress Test

Abstract

Conference

Bibliographical note

NREL Publication Number

Keywords

UN SDGs

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