@misc{161c961fd9514f13a2952a0257d5599d,
title = "Requirements for a Standard Test to Rate the Durability of PV Modules at System Voltage (Presentation): NREL (National Renewable Energy Laboratory)",
abstract = "Degradation modes in photovoltaic modules under system bias voltage stress are described and classified.",
keywords = "degradation, modules, photovoltaic, PV, reliability, voltage",
author = "Peter Hacke and Kent Terwilliger and Michael Kempe and Sarah Kurtz and Ian Bennett and Mario Kloos",
year = "2011",
language = "American English",
series = "Presented at the 2011 Photovoltaic Module Reliability Workshop, 16-17 February 2011, Golden, Colorado",
type = "Other",
}