Research on the Structural and Electronic Properties of Defects in Amorphous Silicon, Annual Subcontract Report, July 1988 - August 1989

    Research output: NRELSubcontract Report

    Original languageAmerican English
    Number of pages53
    StatePublished - 1990

    Bibliographical note

    Work performed by Xerox Palo Alto Research Center, Palo Alto, California

    NREL Publication Number

    • SERI/SR-211-3830

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