Resistivity Measurement of Thin Semiconductor Films on Metallic Substrates

    Research output: Contribution to journalArticle

    Original languageAmerican English
    Pages (from-to)77-78
    Number of pages2
    JournalApplied Physics Letters
    Volume35
    Issue number1
    DOIs
    StatePublished - 1979

    NREL Publication Number

    • ACNR/JA-212-3332

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