Resistivity Measurement of Thin Semiconductor Films on Metallic Substrates

Research output: Contribution to journal › Article

NLR Publication Number

@article{01602d381c114df88f39c26adb90911e,

title = "Resistivity Measurement of Thin Semiconductor Films on Metallic Substrates",

author = "NREL",

year = "1979",

doi = "10.1063/1.90899",

language = "American English",

volume = "35",

pages = "77--78",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "1",

}