Results from an International Interlaboratory Study on Light- and Elevated Temperature-Induced Degradation in Solar Modules

Joseph Karas, Ingrid Repins, Karl Berger, Bernhard Kubicek, Fangdan Jiang, Daqi Zhang, Jean-Nicolas Jaubert, Ana Belen Cueli, Tony Sample, Bengt Jaeckel, Matthias Pander, Esther Fokuhl, Max Koentopp, Friederike Kersten, Jun-Hong Choi, Birinchi Bora, Chandan Banerjee, Stefan Wendlandt, Tristan Erion-Lorico, Kenneth SauerJon Tsan, Mauro Pravettoni, Mauro Caccivio, Giovanni Bellenda, Christos Monokroussos, Hamza Maaroufi

Research output: Contribution to journalArticlepeer-review

6 Scopus Citations

Abstract

This paper reports the results of an international interlaboratory comparison study on light- and elevated temperature-induced degradation (LETID) on crystalline silicon photovoltaic (PV) modules. A large global network of PV module manufacturers and PV testing laboratories collaborated to design a protocol for LETID detection and screen a large and diverse set of prototype modules for LETID. Results across labs indicate the reproducibility of LETID testing is likely within ±1% of maximum power (PMP). In intentionally engineered LETID-sensitive modules, mean degradation after the prescribed detection stress is roughly 6% PMP. In other module types the LETID sensitivity is smaller, and in some we observe essentially negligible degradation attributable to LETID. In LETID-sensitive modules, both open-circuit voltage (VOC) and short-circuit current (ISC) degrade by a roughly similar magnitude. We observe, as do previous studies, that LETID affects each cell in a module differently. An investigation of the potential mismatch losses caused by nonuniform LETID degradation found that mismatch loss is insignificant compared to the estimated loss of cell ISC, which drives loss of module ISC. Overall, this work has helped inform the creation of a forthcoming standard technical specification for LETID testing of PV modules, IEC TS 63342 ED1, and should aid in the interpretation of results from that and other LETID tests.

Original languageAmerican English
Pages (from-to)1255-1269
Number of pages15
JournalProgress in Photovoltaics: Research and Applications
Volume30
Issue number11
DOIs
StatePublished - 2022

Bibliographical note

Publisher Copyright:
© 2022 Alliance for Sustainable Energy, LLC. Progress in Photovoltaics: Research and Applications published by John Wiley & Sons Ltd.

NREL Publication Number

  • NREL/JA-5K00-81318

Keywords

  • degradation
  • light- and elevated temperature-induced degradation (LETID)
  • photovoltaics (PV)
  • PV modules
  • silicon
  • solar cells

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