Results from the Development of a Low-Cost, In-Situ, CuInxGa1-xSe2 Composition Sensor Based on X-Ray Fluorescence

    Research output: Contribution to conferencePaper

    Original languageAmerican English
    Pages255-256
    Number of pages2
    StatePublished - 2000
    EventProgram and 2000 NCPV Program Review Meeting - Denver, Colorado
    Duration: 16 Apr 200019 Apr 2000

    Conference

    ConferenceProgram and 2000 NCPV Program Review Meeting
    CityDenver, Colorado
    Period16/04/0019/04/00

    Bibliographical note

    Work performed by Materials Research Group, Inc., Wheat Ridge, Colorado

    NREL Publication Number

    • NREL/CP-520-35738

    Cite this