Abstract
Three crystalline silicon module designs were distributed in five replicas each to five laboratories for testing according to the IEC 62804 (Committee Draft) system voltage durability qualification test for crystalline silicon photovoltaic (PV) modules. The stress tests were performed in environmental chambers at 60 degrees C, 85% relative humidity, 96 h, and with module nameplate system voltageapplied.
Original language | American English |
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Number of pages | 14 |
State | Published - 2013 |
NREL Publication Number
- NREL/PR-5200-60493
Keywords
- IEC
- PV modules
- round robin testing
- standards