Results of the PEP '93 Intercomparison of Reference Cell Calibrations and the Newer Technology Performance Measurements

C. R. Osterwald, S. Anevsky, A. K. Barua, J. Dubard, K. Emery, D. King, J. Metzdorf, F. Nagamine, R. Shimokawa, N. Udayakumar, Y. X. Wang, T. Wittchen, W. Zaaiman, A. Zastrow, J. Zhang

Research output: Contribution to conferencePaperpeer-review

24 Scopus Citations

Abstract

This paper presents the results of an international intercomparison of photovoltaic (PV) performance measurements and calibrations. The intercomparison, which was organized and operated by a group of experts representing national laboratories from across the globe (i.e., the authors of this paper), was accomplished by circulating two sample sets. One set consisted of twenty silicon reference cells that would, hopefully, form the basis of an international PV reference scale. A qualification procedure applied to the calibration results gave average calibration numbers with an overall standard deviation of less than 2% for the entire set. The second set was assembled from a wide range of newer technologies that present unique problems for PV measurements. As might be expected, these results showed much larger differences among laboratories. Methods were then identified that should be used to measure such devices, along with problems to avoid.

Original languageAmerican English
Pages1263-1266
Number of pages4
DOIs
StatePublished - 1996
EventProceedings of the 1996 25th IEEE Photovoltaic Specialists Conference - Washington, DC, USA
Duration: 13 May 199617 May 1996

Conference

ConferenceProceedings of the 1996 25th IEEE Photovoltaic Specialists Conference
CityWashington, DC, USA
Period13/05/9617/05/96

NREL Publication Number

  • NREL/CP-22522

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