Rigorous Coupled Wave Analysis of GaAs Thermophotovoltaic Devices with a Patterned Dielectric Back Contact

Madhan Arulanadam, Jeronimo Buencuerpo, Myles Steiner, Eric Tervo, Leah Kuritzky, Emmett Perl, Brendan Kayes, Justin Briggs, Richard King

Research output: Contribution to conferencePaperpeer-review

2 Scopus Citations

Abstract

In principle, a patterned dielectric back contact structure in a GaAs thermophotovoltaic device boosts the sub-bandgap reflectance. Rigorous coupled wave analysis method is used to study the three dimensional (3D) periodic grating effects of metal point contact diameter and spacing on sub-bandgap reflectance of the device.

Original languageAmerican English
Pages2580-2583
Number of pages4
DOIs
StatePublished - 20 Jun 2021
Event48th IEEE Photovoltaic Specialists Conference, PVSC 2021 - Fort Lauderdale, United States
Duration: 20 Jun 202125 Jun 2021

Conference

Conference48th IEEE Photovoltaic Specialists Conference, PVSC 2021
Country/TerritoryUnited States
CityFort Lauderdale
Period20/06/2125/06/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

NREL Publication Number

  • NREL/CP-5900-81253

Keywords

  • diffraction grating
  • efficiency
  • GaAs
  • patterned dielectric back contact
  • rigorous coupled wave analysis
  • sub-bandgap spectrum
  • thermophotovoltaics

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