Rigorous Coupled Wave Analysis of GaAs Thermophotovoltaic Devices with a Patterned Dielectric Back Contact

Madhan Arulanadam; Jeronimo Buencuerpo; Myles Steiner; Eric Tervo; Leah Kuritzky; Emmett Perl; Brendan Kayes; Justin Briggs; Richard King

doi:10.1109/PVSC43889.2021.9518396

Rigorous Coupled Wave Analysis of GaAs Thermophotovoltaic Devices with a Patterned Dielectric Back Contact

Madhan Arulanadam
, Jeronimo Buencuerpo
, Myles Steiner
, Eric Tervo
, Leah Kuritzky
, Emmett Perl
, Brendan Kayes
, Justin Briggs
, Richard King

Chemistry and Nanoscience

Research output: Contribution to conference › Paper › peer-review

3 Scopus Citations

Abstract

In principle, a patterned dielectric back contact structure in a GaAs thermophotovoltaic device boosts the sub-bandgap reflectance. Rigorous coupled wave analysis method is used to study the three dimensional (3D) periodic grating effects of metal point contact diameter and spacing on sub-bandgap reflectance of the device.

Original language	American English
Pages	2580-2583
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC43889.2021.9518396 https://doi.org/10.1109/PVSC43889.2021.9518396
State	Published - 20 Jun 2021
Event	48th IEEE Photovoltaic Specialists Conference, PVSC 2021 - Fort Lauderdale, United States Duration: 20 Jun 2021 → 25 Jun 2021

Conference

Conference	48th IEEE Photovoltaic Specialists Conference, PVSC 2021
Country/Territory	United States
City	Fort Lauderdale
Period	20/06/21 → 25/06/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

NLR Publication Number

NREL/CP-5900-81253

Keywords

diffraction grating
efficiency
GaAs
patterned dielectric back contact
rigorous coupled wave analysis
sub-bandgap spectrum
thermophotovoltaics

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Arulanadam, M., Buencuerpo, J., Steiner, M., Tervo, E., Kuritzky, L., Perl, E., Kayes, B., Briggs, J., & King, R. (2021). Rigorous Coupled Wave Analysis of GaAs Thermophotovoltaic Devices with a Patterned Dielectric Back Contact. 2580-2583. Paper presented at 48th IEEE Photovoltaic Specialists Conference, PVSC 2021, Fort Lauderdale, United States. https://doi.org/10.1109/PVSC43889.2021.9518396, https://doi.org/10.1109/PVSC43889.2021.9518396

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keywords = "diffraction grating, efficiency, GaAs, patterned dielectric back contact, rigorous coupled wave analysis, sub-bandgap spectrum, thermophotovoltaics",

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Arulanadam, M, Buencuerpo, J, Steiner, M, Tervo, E, Kuritzky, L, Perl, E, Kayes, B, Briggs, J & King, R 2021, 'Rigorous Coupled Wave Analysis of GaAs Thermophotovoltaic Devices with a Patterned Dielectric Back Contact', Paper presented at 48th IEEE Photovoltaic Specialists Conference, PVSC 2021, Fort Lauderdale, United States, 20/06/21 - 25/06/21 pp. 2580-2583. https://doi.org/10.1109/PVSC43889.2021.9518396, https://doi.org/10.1109/PVSC43889.2021.9518396

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T1 - Rigorous Coupled Wave Analysis of GaAs Thermophotovoltaic Devices with a Patterned Dielectric Back Contact

AU - Arulanadam, Madhan

AU - Buencuerpo, Jeronimo

AU - Steiner, Myles

AU - Tervo, Eric

AU - Kuritzky, Leah

AU - Perl, Emmett

AU - Kayes, Brendan

AU - Briggs, Justin

AU - King, Richard

PY - 2021/6/20

Y1 - 2021/6/20

N2 - In principle, a patterned dielectric back contact structure in a GaAs thermophotovoltaic device boosts the sub-bandgap reflectance. Rigorous coupled wave analysis method is used to study the three dimensional (3D) periodic grating effects of metal point contact diameter and spacing on sub-bandgap reflectance of the device.

AB - In principle, a patterned dielectric back contact structure in a GaAs thermophotovoltaic device boosts the sub-bandgap reflectance. Rigorous coupled wave analysis method is used to study the three dimensional (3D) periodic grating effects of metal point contact diameter and spacing on sub-bandgap reflectance of the device.

KW - diffraction grating

KW - efficiency

KW - GaAs

KW - patterned dielectric back contact

KW - rigorous coupled wave analysis

KW - sub-bandgap spectrum

KW - thermophotovoltaics

UR - https://www.scopus.com/pages/publications/85115928679

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DO - 10.1109/PVSC43889.2021.9518396

M3 - Paper

AN - SCOPUS:85115928679

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T2 - 48th IEEE Photovoltaic Specialists Conference, PVSC 2021

Y2 - 20 June 2021 through 25 June 2021

ER -

Rigorous Coupled Wave Analysis of GaAs Thermophotovoltaic Devices with a Patterned Dielectric Back Contact

Abstract

Conference

Bibliographical note

NLR Publication Number

Keywords

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