Role of Charged Defects in Photo-Degradation of Hydrogenated Amorphous Silicon

Role of Charged Defects in Photo-Degradation of Hydrogenated Amorphous Silicon

Research output: Contribution to conference › Paper

Original language	American English
Pages	449-454
Number of pages	6
State	Published - 1992
Event	Amorphous Silicon Technology - 1992: Materials Research Society Symposium - San Francisco, California Duration: 27 Apr 1992 → 1 May 1992

Conference

Conference	Amorphous Silicon Technology - 1992: Materials Research Society Symposium
City	San Francisco, California
Period	27/04/92 → 1/05/92

Bibliographical note

Work performed by Microelectronics Research Center, Iowa State University, Ames, Iowa

NREL Publication Number

ACNR/CP-14601

Cite this

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title = "Role of Charged Defects in Photo-Degradation of Hydrogenated Amorphous Silicon",

author = "NREL",

note = "Work performed by Microelectronics Research Center, Iowa State University, Ames, Iowa; Amorphous Silicon Technology - 1992: Materials Research Society Symposium ; Conference date: 27-04-1992 Through 01-05-1992",

year = "1992",

language = "American English",

pages = "449--454",

}

TY - CONF

T1 - Role of Charged Defects in Photo-Degradation of Hydrogenated Amorphous Silicon

AU - NREL, null

N1 - Work performed by Microelectronics Research Center, Iowa State University, Ames, Iowa

PY - 1992

Y1 - 1992

M3 - Paper

SP - 449

EP - 454

T2 - Amorphous Silicon Technology - 1992: Materials Research Society Symposium

Y2 - 27 April 1992 through 1 May 1992

ER -