Abstract
The performance of CdS/CdTe solar cells made with evaporated Cu as a primary back contact was studied through current-voltage (JV) at different intensities, quantum efficiency (QE) under light and voltage bias, capacitance-voltage (CV), and drive-level capacitance profiling (DLCP) measurements. The results show that while modest amounts of Cu enhance cell performance, excessive amounts degradedevice quality and reduce performance. The analysis is supported with numerical simulations to reproduce and explain some of the experimental results.
| Original language | American English |
|---|---|
| Number of pages | 6 |
| State | Published - 2006 |
| Event | 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion (WCPEC-4) - Waikoloa, Hawaii Duration: 7 May 2006 → 12 May 2006 |
Conference
| Conference | 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion (WCPEC-4) |
|---|---|
| City | Waikoloa, Hawaii |
| Period | 7/05/06 → 12/05/06 |
NREL Publication Number
- NREL/CP-520-39923
Keywords
- back contacts
- capacitance voltage (CV)
- current-voltage (I-V)
- drive-level capacitance profiling (DLCP)
- quantum efficiency (QE)
- solar cells