Abstract
Abstracts from the NREL workshop held June 27-29, 1994 in Beaver Creek, Colorado on the role of point defects and defect complexes in silicon device fabrication.
| Original language | American English |
|---|---|
| Number of pages | 58 |
| State | Published - 1994 |
| Event | Fourth Workshop - Beaver Creek, Colorado Duration: 27 Jun 1994 → 29 Jun 1994 |
Conference
| Conference | Fourth Workshop |
|---|---|
| City | Beaver Creek, Colorado |
| Period | 27/06/94 → 29/06/94 |
NLR Publication Number
- NREL/CP-413-7033
Keywords
- fabrication
- photovoltaics (PV)
- solar cells
Fingerprint
Dive into the research topics of 'Role of Point Defects/Defect Complexes in Silicon Device Processing: Book of Abstracts from the Fourth Workshop, 27-29 June 1994, Beaver Creek, Colorado'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver