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Scanning Kelvin Probe Microscopy: A Tool to Investigate Nano-Scale Doping Non-Uniformities in Poly-Si/SiOx Contacts: Preprint
- Abhijit Kale
- , Sanjini Nanayakkara
- , William Nemeth
- , Harvey Guthrey
- , Matthew Page
- , Mowafak Al-Jassim
- , David Young
- , Paul Stradins
- , Sumit Agarwal
Research output: Contribution to conference › Paper