Scanning Kelvin Probe Microscopy of CdTe Solar Cells Measured Under Different Bias Conditions: Paper No. 1165-M08-28

Helio Moutinho

Scanning Kelvin Probe Microscopy of CdTe Solar Cells Measured Under Different Bias Conditions: Paper No. 1165-M08-28

Helio Moutinho

Materials Science

Research output: Contribution to conference › Paper

Original language	American English
Pages	361-366
Number of pages	6
State	Published - 2009
Event	Thin-Film Compound Semiconductor Photovoltaics - 2009: Materials Research Society Symposium - San Francisco, California Duration: 13 Apr 2009 → 17 Apr 2009

Conference

Conference	Thin-Film Compound Semiconductor Photovoltaics - 2009: Materials Research Society Symposium
City	San Francisco, California
Period	13/04/09 → 17/04/09

NREL Publication Number

NREL/CP-520-44410

Keywords

solar cells
thin films

Cite this

@conference{eb18ed13bf114b5c83b6ac8f8afd0023,

title = "Scanning Kelvin Probe Microscopy of CdTe Solar Cells Measured Under Different Bias Conditions: Paper No. 1165-M08-28",

keywords = "solar cells, thin films",

author = "Helio Moutinho",

year = "2009",

language = "American English",

pages = "361--366",

note = "Thin-Film Compound Semiconductor Photovoltaics - 2009: Materials Research Society Symposium ; Conference date: 13-04-2009 Through 17-04-2009",

}