Scanning Tunneling Microscopy Studies of the Surfaces of a-Si:H and a-SiGe:H, Annual Subcontract Report, 1 December 1989 - 31 January 1991

Research output: NREL › Subcontract Report

Work performed by the National Institute of Standards and Technology, Boulder, Colorado

NREL Publication Number

@misc{09d88621bdd74ef0a249f05fde82e772,

title = "Scanning Tunneling Microscopy Studies of the Surfaces of a-Si:H and a-SiGe:H, Annual Subcontract Report, 1 December 1989 - 31 January 1991",

keywords = "amorphous state, film growth, microscopes, photovoltaics, silicon, solar cells",

author = "NREL",

note = "Work performed by the National Institute of Standards and Technology, Boulder, Colorado",

year = "1991",

doi = "10.2172/5681404",

language = "American English",

type = "Other",

}

TY - GEN

T1 - Scanning Tunneling Microscopy Studies of the Surfaces of a-Si:H and a-SiGe:H, Annual Subcontract Report, 1 December 1989 - 31 January 1991

AU - NREL, null

N1 - Work performed by the National Institute of Standards and Technology, Boulder, Colorado

PY - 1991

Y1 - 1991

KW - amorphous state

KW - film growth

KW - microscopes

KW - photovoltaics

KW - silicon

KW - solar cells

U2 - 10.2172/5681404

DO - 10.2172/5681404

M3 - Subcontract Report

ER -