Abstract
Ge(mnn) surfaces between (1 0 0) and (1 1 1) were annealed under either arsine or phosphine in a metal-organic chemical vapor deposition chamber, then imaged with a scanning tunneling microscope. In general, arsine-exposed Ge surfaces are facetted, while phosphine-exposed surfaces remain flat. For the arsine-exposed Ge surfaces, four stable facetting directions have been identified: (1 0 0), (11, 3, 3), (9 5 5), and (1 1 1).
| Original language | American English |
|---|---|
| Pages (from-to) | 410-414 |
| Number of pages | 5 |
| Journal | Journal of Crystal Growth |
| Volume | 225 |
| Issue number | 2-4 |
| DOIs | |
| State | Published - May 2001 |
NLR Publication Number
- NREL/JA-520-31102
Keywords
- A1. Scanning tunneling microscopy
- A3. Metalorganic vapor phase epitaxy
- B1. Arsine
- B1. Germanium
- B1. Phosphine
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