Abstract
The solid state and electrochemical properties of the junction between highly doped PMeT (PMeT = poly(3-methylthiophene)) and n-CdS have been characterized by current voltage (J-V) and capacitance-voltage (C-V) measurements. Junction characteristics of the n-CdS:PMeT:Au cell are compared with those of metal:n-CdS solid state Schottky barrier devices. Alterations in the junction characteristics are observed when the PMeT:n-CdS solid state device contacts an aqueous electrolyte.
| Original language | American English |
|---|---|
| Pages (from-to) | 681-686 |
| Number of pages | 6 |
| Journal | Synthetic Metals |
| Volume | 28 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - 1989 |
NLR Publication Number
- ACNR/JA-233-11326