Second Harmonic Generation in Ordered Ga1-xInxP

B. Fluegel; A. Mascarenhas; J. Geisz; J. Olson

doi:10.1103/PhysRevB.57.R6787

Second Harmonic Generation in Ordered Ga1-xInxP

B. Fluegel, A. Mascarenhas, J. Geisz, J. Olson

Chemistry and Nanoscience

National Renewable Energy Laboratory

Research output: Contribution to journal › Article › peer-review

17 Scopus Citations

Abstract

Reflection second harmonic generation (SHG) has been used to measure the rotation/reflection properties of spontaneously ordered (Formula presented) Particular conditions are identified in which the SHG signal arises solely from the order-induced symmetry breaking of the 4¯ operation in zinc blende. By extending the usual experimental techniques to the epilayer edges, the point group of ordered (Formula presented) was completely determined from optical methods, and the four components of the nonlinear susceptibility were measured. The case of double-variant samples is also discussed.

Original language	American English
Pages (from-to)	R6787-R6790
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	57
Issue number	12
DOIs	https://doi.org/10.1103/PhysRevB.57.R6787 https://doi.org/10.1103/PhysRevB.57.R6787
State	Published - 1998

NREL Publication Number

NREL/JA-590-25642

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abstract = "Reflection second harmonic generation (SHG) has been used to measure the rotation/reflection properties of spontaneously ordered (Formula presented) Particular conditions are identified in which the SHG signal arises solely from the order-induced symmetry breaking of the 4¯ operation in zinc blende. By extending the usual experimental techniques to the epilayer edges, the point group of ordered (Formula presented) was completely determined from optical methods, and the four components of the nonlinear susceptibility were measured. The case of double-variant samples is also discussed.",

author = "B. Fluegel and A. Mascarenhas and J. Geisz and J. Olson",

year = "1998",

doi = "10.1103/PhysRevB.57.R6787",

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journal = "Physical Review B - Condensed Matter and Materials Physics",

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AU - Fluegel, B.

AU - Mascarenhas, A.

AU - Geisz, J.

AU - Olson, J.

PY - 1998

Y1 - 1998

N2 - Reflection second harmonic generation (SHG) has been used to measure the rotation/reflection properties of spontaneously ordered (Formula presented) Particular conditions are identified in which the SHG signal arises solely from the order-induced symmetry breaking of the 4¯ operation in zinc blende. By extending the usual experimental techniques to the epilayer edges, the point group of ordered (Formula presented) was completely determined from optical methods, and the four components of the nonlinear susceptibility were measured. The case of double-variant samples is also discussed.

AB - Reflection second harmonic generation (SHG) has been used to measure the rotation/reflection properties of spontaneously ordered (Formula presented) Particular conditions are identified in which the SHG signal arises solely from the order-induced symmetry breaking of the 4¯ operation in zinc blende. By extending the usual experimental techniques to the epilayer edges, the point group of ordered (Formula presented) was completely determined from optical methods, and the four components of the nonlinear susceptibility were measured. The case of double-variant samples is also discussed.

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U2 - 10.1103/PhysRevB.57.R6787

DO - 10.1103/PhysRevB.57.R6787

M3 - Article

AN - SCOPUS:0000017804

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JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 12

ER -

Second Harmonic Generation in Ordered Ga1-xInxP

Abstract

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