Second Harmonic Generation in Ordered Ga1-xInxP

B. Fluegel, A. Mascarenhas, J. Geisz, J. Olson

Research output: Contribution to journalArticlepeer-review

17 Scopus Citations


Reflection second harmonic generation (SHG) has been used to measure the rotation/reflection properties of spontaneously ordered (Formula presented) Particular conditions are identified in which the SHG signal arises solely from the order-induced symmetry breaking of the 4¯ operation in zinc blende. By extending the usual experimental techniques to the epilayer edges, the point group of ordered (Formula presented) was completely determined from optical methods, and the four components of the nonlinear susceptibility were measured. The case of double-variant samples is also discussed.

Original languageAmerican English
Pages (from-to)R6787-R6790
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number12
StatePublished - 1998

NREL Publication Number

  • NREL/JA-590-25642


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