Abstract
The success of recently discovered absorber materials for photovoltaic applications has been generating increasing interest in systematic materials screening over the last years. However, the key for a successful materials screening is a suitable selection metric that goes beyond the Shockley-Queisser theory that determines the thermodynamic efficiency limit of an absorber material solely by its band-gap energy. In this work, we develop a selection metric to quantify the potential photovoltaic efficiency of a material. Our approach is compatible with detailed balance and applicable in computational and experimental materials screening. We use the complex refractive index to calculate radiative and nonradiative efficiency limits and the respective optimal thickness in the high mobility limit. We compare our model to the widely applied selection metric by Yu and Zunger [Phys. Rev. Lett. 108, 068701 (2012)PRLTAO0031-900710.1103/PhysRevLett.108.068701] with respect to their dependence on thickness, internal luminescence quantum efficiency, and refractive index. Finally, the model is applied to complex refractive indices calculated via electronic structure theory.
Original language | American English |
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Article number | 024032 |
Number of pages | 13 |
Journal | Physical Review Applied |
Volume | 8 |
Issue number | 2 |
DOIs | |
State | Published - 31 Aug 2017 |
Bibliographical note
Publisher Copyright:© 2017 American Physical Society.
NREL Publication Number
- NREL/JA-5K00-70169
Keywords
- optoelectronics
- semiconductor physics