Self-Aligned, Selective Area Poly-Si/SiO2 Passivated Contacts for Enhanced Photocurrent in Front/Back Solar Cells: Preprint

David Young, San Theingi, Vincenzo LaSalvia, Kejun Chen, William Nemeth, Dawn Findley, Matthew Page, Pauls Stradins

Research output: Contribution to conferencePaper

Abstract

Poly-Si/SiO2 passivated contact front/back solar cells suffer low Jsc due to parasitic absorption in the front poly-Si layer. We demonstrate a self-aligned, selective area front contact dry-etch technique that retains the as-deposited poly-Si beneath the metal grid lines but thins it elsewhere. Jsc improves by 0.7 mA/cm2 over our standard 40 nm thick poly-Si. Greater improvements are expected with thicker poly-Si needed for fired metal contacts. Surface passivation is slightly diminished with poly-Si thinning but can be partially restored with re-hydrogenation.
Original languageAmerican English
Number of pages7
StatePublished - 2019
Event46th IEEE Photovoltaic Specialists Conference (PVSC 46) - Chicago, Illinois
Duration: 16 Jun 201921 Jun 2019

Conference

Conference46th IEEE Photovoltaic Specialists Conference (PVSC 46)
CityChicago, Illinois
Period16/06/1921/06/19

Bibliographical note

See NREL/CP-5900-76354 for paper as published in IEEE proceedings

NREL Publication Number

  • NREL/CP-5900-74072

Keywords

  • passivated contacts
  • RIE etching
  • silicon
  • solar cell

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