Abstract
Poly-Si/SiO2 passivated contact front/back solar cells suffer low Jsc due to parasitic absorption in the front poly-Si layer. We demonstrate a self-aligned, selective area front contact dry-etch technique that retains the as-deposited poly-Si beneath the metal grid lines but thins it elsewhere. Jsc improves by 0.7 mA/cm2 over our standard 40 nm thick poly-Si. Greater improvements are expected with thicker poly-Si needed for fired metal contacts. Surface passivation is slightly diminished with poly-Si thinning but can be partially restored with re-hydrogenation.
Original language | American English |
---|---|
Number of pages | 7 |
State | Published - 2019 |
Event | 46th IEEE Photovoltaic Specialists Conference (PVSC 46) - Chicago, Illinois Duration: 16 Jun 2019 → 21 Jun 2019 |
Conference
Conference | 46th IEEE Photovoltaic Specialists Conference (PVSC 46) |
---|---|
City | Chicago, Illinois |
Period | 16/06/19 → 21/06/19 |
Bibliographical note
See NREL/CP-5900-76354 for paper as published in IEEE proceedingsNREL Publication Number
- NREL/CP-5900-74072
Keywords
- passivated contacts
- RIE etching
- silicon
- solar cell