Self-Aligned, Selective Area Poly-Si/SiO2 Passivated Contacts for Enhanced Photocurrent in Front/Back Solar Cells

David Young, San Theingi, Vincenzo LaSalvia, Kejun Chen, William Nemeth, Dawn Findley, Matthew Page, Pauls Stradins

Research output: Contribution to conferencePaperpeer-review

3 Scopus Citations

Abstract

Poly-Si/SiO2 passivated contact front/back solar cells suffer low Jsc due to parasitic absorption in the front poly-Si layer. We demonstrate a self-aligned, selective area front contact dry-etch technique that retains the as-deposited poly-Si beneath the metal grid lines but thins it elsewhere. Jsc improves by 0.7 mA/cm2 over our standard 40 nm thick poly-Si. Greater improvements are expected with thicker poly-Si needed for fired metal contacts. Surface passivation is slightly diminished with poly-Si thinning but can be partially restored with rehydrogenation.

Original languageAmerican English
Pages2211-2214
Number of pages4
DOIs
StatePublished - Jun 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: 16 Jun 201921 Jun 2019

Conference

Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/TerritoryUnited States
CityChicago
Period16/06/1921/06/19

Bibliographical note

See NREL/CP-5900-74072 for preprint

NREL Publication Number

  • NREL/CP-5900-76354

Keywords

  • Ohmic contacts
  • photovoltaic cells
  • silicon devices

Fingerprint

Dive into the research topics of 'Self-Aligned, Selective Area Poly-Si/SiO2 Passivated Contacts for Enhanced Photocurrent in Front/Back Solar Cells'. Together they form a unique fingerprint.

Cite this