Sequential Etch Analysis of Electron Injection in p+-GaAs

doi:10.1109/16.3384

Sequential Etch Analysis of Electron Injection in p+-GaAs

Research output: Contribution to journal › Article

Original language	American English
Pages (from-to)	1159-1161
Number of pages	3
Journal	IEEE Transactions on Electron Devices
Volume	35
Issue number	7
DOIs	https://doi.org/10.1109/16.3384
State	Published - 1988

Bibliographical note

Work performed by Eastman Kodak Corporation; School of Electrical Engineering, Purdue University, West Lafayette, Indiana; Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, Texas; and Spire Corporation, Bedford, Massachusetts

NREL Publication Number

ACNR/JA-10527

Access to Document

10.1109/16.3384

Cite this

@article{b676e51ac17849eab2d9a2b510ca69ab,

title = "Sequential Etch Analysis of Electron Injection in p+-GaAs",

author = "NREL",

note = "Work performed by Eastman Kodak Corporation; School of Electrical Engineering, Purdue University, West Lafayette, Indiana; Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, Texas; and Spire Corporation, Bedford, Massachusetts",

year = "1988",

doi = "10.1109/16.3384",

language = "American English",

volume = "35",

pages = "1159--1161",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "7",

}

TY - JOUR

T1 - Sequential Etch Analysis of Electron Injection in p+-GaAs

AU - NREL, null

N1 - Work performed by Eastman Kodak Corporation; School of Electrical Engineering, Purdue University, West Lafayette, Indiana; Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, Texas; and Spire Corporation, Bedford, Massachusetts

PY - 1988

Y1 - 1988

U2 - 10.1109/16.3384

DO - 10.1109/16.3384

M3 - Article

SN - 0018-9383

VL - 35

SP - 1159

EP - 1161

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 7

ER -