Setting Priorities for Photovoltaic Reliability Research Using Criticality Analysis

Research output: Contribution to journalArticlepeer-review


A forward-looking research opportunity number (RON) is defined for photovoltaic reliability researchers. The RON enables researchers to prioritize their efforts toward the highest impact. For a given degradation mode, the RON is based on three factors: the effect on levelized cost of electricity, the susceptibility of future module products, and the maturity of accelerated tests that can detect and quantify the mode. Reporting bias is avoided because the RON does not rely on polls. The RON is derived for three example cases: light and elevated temperature degradation, backsheet cracking, and antireflective coating abrasion. These examples demonstrate that targeted research has reduced the risk for these modes over the last several years.
Original languageAmerican English
Pages (from-to)46-52
Number of pages7
JournalIEEE Journal of Photovoltaics
Issue number1
StatePublished - 2024

NREL Publication Number

  • NREL/JA-5F00-86148


  • criticality analysis
  • failure modes and effects analysis (FMEA)
  • photovoltaics (PV)
  • reliability
  • research opportunity number (RON)
  • risk priority number (RPN)


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