Seventh Workshop on the Role of Impurities and Defects in Silicon Device Processing: Summary of the Panel Discussions, 11-13 August 1997, Vail, Colorado

    Research output: NRELTechnical Report

    Abstract

    This report is a summary of the panel discussions included with the Seventh Workshop on the Role of Impurities and Defects in Silicon Device Processing. The theme of the workshop was 'R&D Issues for Crystalline Silicon to Support GW/Yr Goal by the Year 2010.' This workshop provided a forum for an informal exchange of information between researchers in the photovoltaic and nonphotovoltaic fieldson various aspects of impurities and defects in silicon, their dynamics during device processing, and their application in defect engineering. This interaction helped establish a knowledge base that can be used for improving device-fabrication processes to enhance solar-cell performance and reduce cell costs. It also provided an excellent opportunity for researchers from industry anduniversities to recognize mutual needs for future joint research.
    Original languageAmerican English
    Number of pages15
    StatePublished - 1997

    NREL Publication Number

    • NREL/CP-520-23549

    Keywords

    • defects
    • devices
    • fabrication
    • impurities
    • photovoltaics (PV)
    • silicon
    • solar cells

    Fingerprint

    Dive into the research topics of 'Seventh Workshop on the Role of Impurities and Defects in Silicon Device Processing: Summary of the Panel Discussions, 11-13 August 1997, Vail, Colorado'. Together they form a unique fingerprint.

    Cite this