Abstract
The results of structural and electrical characterizations of SrTiO 3 thin films deposited onto MgO and LaAlO3 substrates by pulsed laser deposition technique are presented. The influence of substrate and annealing procedure on the crystalline structure and dielectric properties of these ferroelectric thin films are investigated. The obtained experimental data are analyzed in terms of the Landau theory taking into account the room-temperature lattice mismatch of the ferroelectric and substrates as well as the difference in their thermal expansion. It is shown that the behavior of the SrTiO3 thin films could not be attributed to the effect of the film/substrate mechanical coupling. As a possible nature of the observed behavior one can consider the non-stoichiometry of the film composition caused by the chemical contact of the film with the substrate and by the annealing.
Original language | American English |
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Pages (from-to) | 1371-1379 |
Number of pages | 9 |
Journal | Integrated Ferroelectrics |
Volume | 58 |
DOIs | |
State | Published - 2003 |
NREL Publication Number
- NREL/JA-520-36170
Keywords
- Dielectric properties
- Ferroelectric thin films
- Misfit strains
- Non-stoichiometry
- Phase transition