Short-Term Metal/Organic Interface Stability Investigations of Organic Photovoltaic Devices: Preprint

Matthew Reese

Short-Term Metal/Organic Interface Stability Investigations of Organic Photovoltaic Devices: Preprint

Research output: Contribution to conference › Paper

Abstract

This paper addresses one source of degradation in OPV devices: the metal/organic interface. The basic approach was to study the completed device stability vs. the stability of the organic film itself as shown in subsequent devices fabricated from the films.

Original language	American English
Number of pages	6
State	Published - 2008
Event	33rd IEEE Photovoltaic Specialists Conference - San Diego, California Duration: 11 May 2008 → 16 May 2008

Conference

Conference	33rd IEEE Photovoltaic Specialists Conference
City	San Diego, California
Period	11/05/08 → 16/05/08

NREL Publication Number

NREL/CP-270-42568

Keywords

electrodes
intrinsic decomposition
metal/organic interface
one sun illumination
open circuit voltage
organic photovoltaics
short circuit current density

Access to Document

https://www.nrel.gov/docs/fy08osti/42568.pdf

Cite this

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title = "Short-Term Metal/Organic Interface Stability Investigations of Organic Photovoltaic Devices: Preprint",

abstract = "This paper addresses one source of degradation in OPV devices: the metal/organic interface. The basic approach was to study the completed device stability vs. the stability of the organic film itself as shown in subsequent devices fabricated from the films.",

keywords = "electrodes, intrinsic decomposition, metal/organic interface, one sun illumination, open circuit voltage, organic photovoltaics, short circuit current density",

author = "Matthew Reese",

year = "2008",

language = "American English",

note = "33rd IEEE Photovoltaic Specialists Conference ; Conference date: 11-05-2008 Through 16-05-2008",

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AU - Reese, Matthew

PY - 2008

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N2 - This paper addresses one source of degradation in OPV devices: the metal/organic interface. The basic approach was to study the completed device stability vs. the stability of the organic film itself as shown in subsequent devices fabricated from the films.

AB - This paper addresses one source of degradation in OPV devices: the metal/organic interface. The basic approach was to study the completed device stability vs. the stability of the organic film itself as shown in subsequent devices fabricated from the films.

KW - electrodes

KW - intrinsic decomposition

KW - metal/organic interface

KW - one sun illumination

KW - open circuit voltage

KW - organic photovoltaics

KW - short circuit current density

M3 - Paper

T2 - 33rd IEEE Photovoltaic Specialists Conference

Y2 - 11 May 2008 through 16 May 2008

ER -

Short-Term Metal/Organic Interface Stability Investigations of Organic Photovoltaic Devices: Preprint

Abstract

Conference

NREL Publication Number

Keywords

Access to Document

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Cite this