Si-H Bonding in Low Hydrogen Content Amorphous Silicon Films as Probed by Infrared Spectroscopy and X-Ray Diffraction

Research output: Contribution to journal › Article › peer-review

NREL Publication Number

@article{e8a2f236343b42f3b07659c2d9678a9c,

title = "Si-H Bonding in Low Hydrogen Content Amorphous Silicon Films as Probed by Infrared Spectroscopy and X-Ray Diffraction",

author = "NREL",

year = "2000",

doi = "10.1063/1.372073",

language = "American English",

volume = "87",

pages = "1650--1658",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "4",

}