Abstract
This paper evaluates the individual module and array performance of Siemens Solar Industries' copper indium diselenide (CIS) polycrystalline thin-film technology. This is accomplished by studying module and array performance over time. Preliminary temperature coefficients for maximum power, maximum-power voltage, maximum-power current, open-circuit voltage, short-circuit current, and fill factorare determined at both the module and array level. These coefficients are used to correct module/array performance to 25 degrees Celsius to evaluate stability. We show that CIS exhibits a strong inverse correlation between array power and back-of-module temperature. This is due mainly to the narrow bandgap of the CIS material, which results in a strong inverse correlation between voltage andtemperature. We also show that the temperature corrected module and array performance has been relatively stable over the evaluation interval (2 years).
Original language | American English |
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Number of pages | 6 |
DOIs | |
State | Published - 1996 |
NREL Publication Number
- NREL/TP-411-20413
Keywords
- array performance
- CIS
- copper indium diselenide (CIS)
- module performance
- photovoltaics (PV)
- polycrystalline thin films
- PV modules