Silicon Ingot Lifetime Tester for Large Crystals

Silicon Ingot Lifetime Tester for Large Crystals

NREL

Chemistry and Nanoscience

Research output: Contribution to conference › Paper

Original language	American English
Pages	365-372
Number of pages	8
State	Published - 2000
Event	Symposia on ALTECH 99, Satellite Symposium to ESSDERC 99, and the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices - Leuven, Belgium Duration: 1 Jan 1999 → …

Conference

Conference	Symposia on ALTECH 99, Satellite Symposium to ESSDERC 99, and the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
City	Leuven, Belgium
Period	1/01/99 → …

Bibliographical note

For preprint version, including full-text online document, see NREL/CP-590-26499

NLR Publication Number

NREL/CP-590-29981

Cite this

@conference{4b0837e7b40b49e682fea19e891571c6,

title = "Silicon Ingot Lifetime Tester for Large Crystals",

author = "NREL",

note = "For preprint version, including full-text online document, see NREL/CP-590-26499; Symposia on ALTECH 99, Satellite Symposium to ESSDERC 99, and the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices ; Conference date: 01-01-1999",

year = "2000",

language = "American English",

pages = "365--372",

}

TY - CONF

T1 - Silicon Ingot Lifetime Tester for Large Crystals

AU - NREL, null

N1 - For preprint version, including full-text online document, see NREL/CP-590-26499

PY - 2000

Y1 - 2000

M3 - Paper

SP - 365

EP - 372

T2 - Symposia on ALTECH 99, Satellite Symposium to ESSDERC 99, and the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

Y2 - 1 January 1999

ER -