Abstract
To enable widespread deployment of GaAs PV, the cost of single crystal substrates must be dramatically reduced. Here we present an indium-bonded exfoliation technique that produces substrates for III-V growth by exfoliation of macroscopic single crystals. Beginning with a search of available substrates, we identified several model materials that are lattice matched to III-Vs. Bi 2 Se 3 single crystals were grown via the Bridgman technique in order to demonstrate our exfoliation method. From a centimeter diameter single crystal, up to eleven substrates with RMS roughness of 0.04 nm in a 20x20 micron region were exfoliated using this method. Large area AFM scans determined a terrace length of 72 um between step edges. Thicknesses were determined to range from 40-160 um using cross-sectional SEM. This exfoliation technique opens the door to the widespread study of layered materials as epitaxial substrates.
Original language | American English |
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Pages | 3406-3409 |
Number of pages | 4 |
DOIs | |
State | Published - 2018 |
Event | 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) - Washington, D.C. Duration: 25 Jun 2017 → 30 Jun 2017 |
Conference
Conference | 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) |
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City | Washington, D.C. |
Period | 25/06/17 → 30/06/17 |
NREL Publication Number
- NREL/CP-5K00-67820
Keywords
- 2D materials
- exfoliation
- single crystal growth