Size Dependence of the Bandgap of Plasma Synthesized Silicon Nanoparticles Through Direct Introduction of Sulfur Hexafluoride

Pauls Stradins, S. Theingi, T. Guan, C. Kendrick, G. Klafehn, B. Gorman, P. Taylor, M. Lusk, R. Collins

Research output: Contribution to journalArticlepeer-review

3 Scopus Citations

Abstract

Developing silicon nanoparticle (SiNP) synthesis techniques that allow for straightforward control of nanoparticle size and associated optical properties is critical to potential applications of these materials. In addition, it is, in general, hard to probe the absorption threshold in these materials due to silicon's low absorption coefficient. In this study, size is controlled through direct introduction of sulfur hexafluoride (SF6) into the dilute silane precursor of plasma synthesized SiNPs. Size reduction by nearly a factor of two with high crystallinity independent of size is demonstrated. The optical absorption spectra of the SiNPs in the vicinity of the bandgap are measured using photothermal deflection spectroscopy. Bandgap as a function of size is extracted taking into account the polydispersity of the samples. A systematic blue shift in absorption edge due to quantum confinement in the SiNPs is observed with increasing flow of SF6. Photoluminescence (PL) spectra show a similar blue shift with size. However, a ∼300 meV difference in energy between emission and absorption for all sizes suggests that PL emission involves a defect related process. This shows that, while PL may allow size-induced shifts in the bandgap of SiNPs to be monitored, it cannot be relied on to give an accurate value for the bandgap as a function of size.

Original languageAmerican English
Article number163111
Number of pages5
JournalApplied Physics Letters
Volume107
Issue number16
DOIs
StatePublished - 19 Oct 2015

Bibliographical note

Publisher Copyright:
� 2015 AIP Publishing LLC.

NREL Publication Number

  • NREL/JA-5J00-65505

Keywords

  • bandgap
  • optical absorption
  • phototherma spectroscopy
  • silicon
  • X-ray diffraction

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