Small-Angle Neutron Scattering Studies of a-Si:H and a-Si:D

Research output: Contribution to conferencePaper

Abstract

The heterogeneity of hydrogen and deuterium on the nanometer scale has been probed by samll-angle neutron scattering (SANS) from a-Si:H and a-Si:D films. Films were depsoited by two techniques, plasma-enhanced chemical vapor deposition (PECVD) and hot-wire chemical vapor deposition (HWCVD) using conditions that yield high quality films and devices.
Original languageAmerican English
Pages221-222
Number of pages2
StatePublished - 2000
EventProgram and NCPV Program Review Meeting 2000 - Denver Colorado
Duration: 16 Apr 200019 Apr 2000

Conference

ConferenceProgram and NCPV Program Review Meeting 2000
CityDenver Colorado
Period16/04/0019/04/00

NREL Publication Number

  • NREL/CP-520-29669

Keywords

  • amorphous Si
  • applications
  • cadmium telluride (CdTe) photovoltaic solar cells modules
  • components
  • concentrators
  • copper indium diselenide (CIS)
  • crystalline silicon (x-Si) (c-Si)
  • manufacturing
  • markets
  • NCPV
  • photovoltaics (PV)
  • research and development (R&D)
  • systems
  • systems integration
  • thin films

Fingerprint

Dive into the research topics of 'Small-Angle Neutron Scattering Studies of a-Si:H and a-Si:D'. Together they form a unique fingerprint.

Cite this