Small-Angle Neutron Scattering Studies of a-Si:H and a-Si:D

    Research output: Contribution to conferencePaper


    The heterogeneity of hydrogen and deuterium on the nanometer scale has been probed by samll-angle neutron scattering (SANS) from a-Si:H and a-Si:D films. Films were depsoited by two techniques, plasma-enhanced chemical vapor deposition (PECVD) and hot-wire chemical vapor deposition (HWCVD) using conditions that yield high quality films and devices.
    Original languageAmerican English
    Number of pages2
    StatePublished - 2000
    EventProgram and NCPV Program Review Meeting 2000 - Denver Colorado
    Duration: 16 Apr 200019 Apr 2000


    ConferenceProgram and NCPV Program Review Meeting 2000
    CityDenver Colorado

    NREL Publication Number

    • NREL/CP-520-29669


    • amorphous Si
    • applications
    • cadmium telluride (CdTe) photovoltaic solar cells modules
    • components
    • concentrators
    • copper indium diselenide (CIS)
    • crystalline silicon (x-Si) (c-Si)
    • manufacturing
    • markets
    • NCPV
    • photovoltaics (PV)
    • research and development (R&D)
    • systems
    • systems integration
    • thin films


    Dive into the research topics of 'Small-Angle Neutron Scattering Studies of a-Si:H and a-Si:D'. Together they form a unique fingerprint.

    Cite this