Small-Angle X-Ray Scattering Studies of Microvoids in Amorphous Silicon-Based Semiconductors: Annual Subcontract Report, 1 February 1992 - 31 January 1993

doi:10.2172/10157618

Small-Angle X-Ray Scattering Studies of Microvoids in Amorphous Silicon-Based Semiconductors: Annual Subcontract Report, 1 February 1992 - 31 January 1993

Research output: NREL › Subcontract Report

Original language	American English
Number of pages	51
DOIs	https://doi.org/10.2172/10157618
State	Published - 1994

Bibliographical note

Work performed by Colorado School of Mines, Department of Physics, Golden, Colorado

NREL Publication Number

NREL/TP-411-6612

Keywords

amorphous silicon
photovoltaics
semiconductors
small-angle x-ray scattering
solar cells

Access to Document

10.2172/10157618

https://www.nrel.gov/docs/legosti/old/6612.pdf

Cite this

@misc{545b384a83a04d08b220710a2879454b,

title = "Small-Angle X-Ray Scattering Studies of Microvoids in Amorphous Silicon-Based Semiconductors: Annual Subcontract Report, 1 February 1992 - 31 January 1993",

keywords = "amorphous silicon, photovoltaics, semiconductors, small-angle x-ray scattering, solar cells",

author = "NREL",

note = "Work performed by Colorado School of Mines, Department of Physics, Golden, Colorado",

year = "1994",

doi = "10.2172/10157618",

language = "American English",

type = "Other",

}

TY - GEN

T1 - Small-Angle X-Ray Scattering Studies of Microvoids in Amorphous Silicon-Based Semiconductors: Annual Subcontract Report, 1 February 1992 - 31 January 1993

AU - NREL, null

N1 - Work performed by Colorado School of Mines, Department of Physics, Golden, Colorado

PY - 1994

Y1 - 1994

KW - amorphous silicon

KW - photovoltaics

KW - semiconductors

KW - small-angle x-ray scattering

KW - solar cells

U2 - 10.2172/10157618

DO - 10.2172/10157618

M3 - Subcontract Report

ER -