Small-Angle X-Ray Scattering Studies of Microvoids in Amorphous-Silicon-Based Semiconductors: Final Subcontract Report, 1 February 1991 - 31 January 1994

    Research output: NRELSubcontract Report

    Original languageAmerican English
    Number of pages44
    StatePublished - 1994

    Bibliographical note

    Work performed by Colorado School of Mines, Department of Physics, Golden, Colorado

    NREL Publication Number

    • NREL/TP-411-6855


    • microvoids
    • photovoltaics
    • semiconductors
    • small-angle x-ray scattering
    • solar cells

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