Small Angle X-Ray Scattering with Microvoids in the a-SiC:H Alloy

Research output: Contribution to conference › Paper

Original language	American English
Pages	39-42
Number of pages	4
State	Published - 1988
Event	International Topical Conference on Hydrogenated Amorphous Silicon Devices and Technology - IBM Thomas J. Watson Research Center, Yorktown Heights, New York Duration: 21 Nov 1988 → 23 Nov 1988

Conference	International Topical Conference on Hydrogenated Amorphous Silicon Devices and Technology
City	IBM Thomas J. Watson Research Center, Yorktown Heights, New York
Period	21/11/88 → 23/11/88

NREL Publication Number

@conference{9064bddbb6b14fa1822b6b173632e81b,

title = "Small Angle X-Ray Scattering with Microvoids in the a-SiC:H Alloy",

author = "NREL",

year = "1988",

language = "American English",

pages = "39--42",

note = "International Topical Conference on Hydrogenated Amorphous Silicon Devices and Technology ; Conference date: 21-11-1988 Through 23-11-1988",

}