Abstract
We performed cyclic loading of photovoltaic laminates with precracked silicon cells to explore if and how loading frequency and contact pressure influence the ensuing gridline wear-out process. A measurement of parallel resistance across cracked gridlines on a laminated cell coupon was used as the metric for gridline electrical contact degradation. A statistical analysis of variance (ANOVA) analysis of the experimental results discerned that loading frequency is a more significant factor than contact pressure for gridline degradation.
| Original language | American English |
|---|---|
| Pages (from-to) | 686-690 |
| Number of pages | 5 |
| Journal | IEEE Journal of Photovoltaics |
| Volume | 15 |
| Issue number | 5 |
| DOIs | |
| State | Published - 2025 |
NREL Publication Number
- NREL/JA-5K00-93985
Keywords
- contact pressure
- loading frequency
- metallization wear
- photovoltaic (PV) cells
- reliability