Some Challenges in Making Accurate and Reproducible Measurements of Minority Carrier Lifetime in High-Quality Si Wafers

  • Bhushan Sopori
  • , Srinivas Devayajanam
  • , Prakash Basnyat
  • , Helio Moutinho
  • , Bill Nemeth
  • , Vincenzo Lasalvia
  • , Steve Johnston
  • , Jeff Binns
  • , Jesse Appel

Research output: Contribution to conference › Paper › peer-review

6 Scopus Citations

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