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Some Challenges in Making Accurate and Reproducible Measurements of Minority Carrier Lifetime in High-Quality Si Wafers
Bhushan Sopori, Srinivas Devayajanam, Prakash Basnyat, Helio Moutinho, Bill Nemeth, Vincenzo Lasalvia, Steve Johnston, Jeff Binns, Jesse Appel
Research output: Contribution to conference › Paper › peer-review
6
Scopus Citations