Spatial Luminescence Imaging of Dopant Incorporation in CdTe Films: Article No. 045304

Harvey Guthrey, John Moseley, Eric Colegrove, David Albin, Wyatt Metzger, Mowafak Al-Jassim, James Burst

Research output: Contribution to journalArticlepeer-review

5 Scopus Citations

Abstract

State-of-the-art cathodoluminescence (CL) spectrum imaging with spectrum-per-pixel CL emission mapping is applied to spatially profile how dopant elements are incorporated into Cadmium telluride (CdTe). Emission spectra and intensity monitor the spatial distribution of additional charge carriers through characteristic variations in the CL emission based on computational modeling. Our results show that grain boundaries play a role in incorporating dopants in CdTe exposed to copper, phosphorus, and intrinsic point defects in CdTe. The image analysis provides critical, unique feedback to understand dopant incorporation and activation in the inhomogeneous CdTe material, which has struggled to reach high levels of hole density.
Original languageAmerican English
Number of pages7
JournalJournal of Applied Physics
Volume121
Issue number4
DOIs
StatePublished - 2017

NREL Publication Number

  • NREL/JA-5K00-67135

Keywords

  • cadmium telluride
  • cathodoluminescence
  • dopant distribution
  • grain boundaries

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