Abstract
Time-resolved photoluminescence was used to map recombination lifetimes in polycrystalline CdS/CdTe solar cells. Typical lifetime profiles indicated spatial variation by factors of 2-3 across 1 cm dimensions. Correlated device efficiency measurements indicated that spatial regions of lifetime minima dominated the open-circuit voltage.
| Original language | American English |
|---|---|
| Pages (from-to) | 2879-2881 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 64 |
| Issue number | 21 |
| DOIs | |
| State | Published - 1994 |
NREL Publication Number
- ACNR/JA-412-13786