Abstract
Scanning confocal microscopy combined with high-resolution spectroscopy is used to probe the spatial variations in the low-temperature (5.0 K) photoluminescence (PL) of partially ordered GalnP2 with a spatial resolution of 0.7 μm. We observe large regions (1-2 μm) wherein the excitonic PL is suppressed up to a factor of four ("defect-rich" regions) when compared to unaffected areas. These defect-rich regions show a commensurate enhancement in the lower energy below gap emission. The spatial extent of this effect is inconsistent with the picture that the low-energy emission originates solely at the antiphase boundaries of the ordered domains and therefore must originate from other defects within the ordered domain as well.
Original language | American English |
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Pages (from-to) | 706-708 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 74 |
Issue number | 5 |
DOIs | |
State | Published - 1 Feb 1999 |
NREL Publication Number
- NREL/JA-590-26078