Abstract
Photoluminescence and photocurrent spectroscopies combined with diffraction-limited and sub- diffraction-limited spatial resolution are achieved via micro-photoluminescence (m-PL) and near-field microscopy (NSOM). These methods are used to examine the photo-response of individual grain boundaries in thin-film, polycrystalline solar cells at room and cryogenic temperatures. A systematic m-PL studyof the effect of CdCl2-treatment on recombination in CdTe/CdS solar cell structures of varying thickness directly reveals the grain-boundary and surface passivation action of this important post-growth processing step. We achieve 50nm (l/10) spatial resolution in near-field Optical Beam Induced Current imaging (n-OBIC) of polycrystalline silicon solar cells using NSOM, at varying stages ofsilicon nitride grain-boundary passivation, and measure lateral variations in photo-response of CdTe/CdS solar cells with subwavelength spatial resolution.
| Original language | American English |
|---|---|
| Number of pages | 5 |
| State | Published - 2005 |
| Event | 2004 DOE Solar Energy Technologies Program Review Meeting - Denver, Colorado Duration: 25 Oct 2004 → 28 Oct 2004 |
Conference
| Conference | 2004 DOE Solar Energy Technologies Program Review Meeting |
|---|---|
| City | Denver, Colorado |
| Period | 25/10/04 → 28/10/04 |
Bibliographical note
Presented at the 2004 DOE Solar Energy Technologies Program Review Meeting, 25-28 October 2004, Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102005-2067; NREL/CD-520-37140)NREL Publication Number
- NREL/CP-590-37037
Keywords
- diffraction-limited
- grain boundary (GBS)
- micro-photoluminescence (m-PL)
- near-field scanning optical microscopy (NSOM)
- photocurrent
- photoluminescence
- polycrystalline silicon
- PV
- solar cells
- spatially resolution
- spectroscopic
- sub- diffraction-limited