Abstract
Assessing photovoltaic module backsheet durability is critical to increasing module lifetime. Lab-based accelerating testing has recently failed to predict large scale failures of widely adopted polymeric materials. Field surveyed data is critical to assess the performance of component lifetime. Using a documented field survey protocol, 13 field surveys were conducted. Each measurement is encoded with its spatial location in respect to the other modules. By combining field survey data on degradation predictors with real time satellite weather data, data-driven predictive models of backsheet degradation were trained. LOESS models were constructed to investigate the spatial dependence of measurements. It was found that micro-climatic effects like treelines, ground surface changes, and elevation changes effected the magnitude and variance of the measurements. A GAM model was created to predict the value of degradation based on measured predictors. The model includes variables on the climate of the system and the location of each measurement in the PV mounting structure. The model performed well with an adj:R2 of 0:95 for yellowness index prediction. The model was cross-validated using k-folds.
Original language | American English |
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Number of pages | 9 |
State | Published - 2022 |
Event | 49th IEEE Photovoltaic Specialists Conference (PVSC 49) - Philadelphia, Pennsylvania Duration: 5 Jun 2022 → 10 Jun 2022 |
Conference
Conference | 49th IEEE Photovoltaic Specialists Conference (PVSC 49) |
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City | Philadelphia, Pennsylvania |
Period | 5/06/22 → 10/06/22 |
Bibliographical note
See NREL/CP-5K00-85098 for paper as published in proceedingsNREL Publication Number
- NREL/CP-5K00-81961
Keywords
- backsheet
- degradation
- field survey
- modeling
- spatio-temporal