Sputtered Aluminum Oxide and p+ Amorphous Silicon Back-Contact for Improved Hole Extraction in Polycrystalline CdSexTe1-x and CdTe Photovoltaics

  • Darius Kuciauskas
  • , Adam Danielson
  • , Amit Munshi
  • , Arthur Onno
  • , William Weigand
  • , Anna Kindvall
  • , Carey Reich
  • , Zhengshan Yu
  • , Jianwei Shi
  • , Ali Abbas
  • , John Walls
  • , Zachary Holman
  • , Walajabad Sampath

Research output: Contribution to conferencePaperpeer-review

4 Scopus Citations

Abstract

A thin layer of Al2O3 at the back of CdSexTe1-x/CdTe devices is shown to passivate the back interface and drastically improve surface recombination lifetimes and photoluminescent response. Despite this, such devices do not show an improvement in open-circuit voltage (VOC.) Adding a p+ amorphous silicon layer behind the Al2O3 bends the conduction band upward, reducing the barrier to hole extraction and improving collection. Further optimization of the Al2O3, amorphous silicon (a-Si), and indium-doped tin oxide (ITO) layers, as well as their interaction with the CdCl2 passivation process, are necessary to translate these electro-optical improvements into gains in voltage.

Original languageAmerican English
Pages3018-3023
Number of pages6
DOIs
StatePublished - Jun 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: 16 Jun 201921 Jun 2019

Conference

Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/TerritoryUnited States
CityChicago
Period16/06/1921/06/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

NLR Publication Number

  • NREL/CP-5900-76285

Keywords

  • a-Si
  • AlO
  • CdTe
  • charge carrier lifetime
  • passivating oxides
  • photovoltaic cells

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