Stability Testing of CdTe/CdS Thin-Film Photovoltaic Modules

doi:10.1109/PVSC.1996.564245

Stability Testing of CdTe/CdS Thin-Film Photovoltaic Modules

Research output: Contribution to conference › Paper

Abstract

High efficiency, durability, and long-term stability are critical components of cost-effective photovoltaic modules. Industry-established protocols for testing efficiency and durability such as ASTM E948, E1036, and the Module Qualification Test, are effective in ensuring the initial module performance and the integrity of the encapsulation and mechanical components. However, these protocols donot adequately test long-term module performance. This paper describes the initial development of an accelerated testing methodology utilizing various applied stresses. The results of more than 2 years of indoor testing indicate that stable CdS/CdTe modules can be produced.

Original language	American English
Pages	785-788
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.1996.564245
State	Published - 1996
Event	Twenty Fifth IEEE Photovoltaic Specialists Conference - Washington, D.C. Duration: 13 May 1996 → 17 May 1996

Conference

Conference	Twenty Fifth IEEE Photovoltaic Specialists Conference
City	Washington, D.C.
Period	13/05/96 → 17/05/96

Bibliographical note

Work performed by Solar Cells Inc., Toledo, Ohio

NREL Publication Number

NREL/CP-22403

Access to Document

10.1109/PVSC.1996.564245

Cite this

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title = "Stability Testing of CdTe/CdS Thin-Film Photovoltaic Modules",

abstract = "High efficiency, durability, and long-term stability are critical components of cost-effective photovoltaic modules. Industry-established protocols for testing efficiency and durability such as ASTM E948, E1036, and the Module Qualification Test, are effective in ensuring the initial module performance and the integrity of the encapsulation and mechanical components. However, these protocols donot adequately test long-term module performance. This paper describes the initial development of an accelerated testing methodology utilizing various applied stresses. The results of more than 2 years of indoor testing indicate that stable CdS/CdTe modules can be produced.",

author = "NREL",

note = "Work performed by Solar Cells Inc., Toledo, Ohio; Twenty Fifth IEEE Photovoltaic Specialists Conference ; Conference date: 13-05-1996 Through 17-05-1996",

year = "1996",

doi = "10.1109/PVSC.1996.564245",

language = "American English",

pages = "785--788",

}

TY - CONF

T1 - Stability Testing of CdTe/CdS Thin-Film Photovoltaic Modules

AU - NREL, null

N1 - Work performed by Solar Cells Inc., Toledo, Ohio

PY - 1996

Y1 - 1996

N2 - High efficiency, durability, and long-term stability are critical components of cost-effective photovoltaic modules. Industry-established protocols for testing efficiency and durability such as ASTM E948, E1036, and the Module Qualification Test, are effective in ensuring the initial module performance and the integrity of the encapsulation and mechanical components. However, these protocols donot adequately test long-term module performance. This paper describes the initial development of an accelerated testing methodology utilizing various applied stresses. The results of more than 2 years of indoor testing indicate that stable CdS/CdTe modules can be produced.

AB - High efficiency, durability, and long-term stability are critical components of cost-effective photovoltaic modules. Industry-established protocols for testing efficiency and durability such as ASTM E948, E1036, and the Module Qualification Test, are effective in ensuring the initial module performance and the integrity of the encapsulation and mechanical components. However, these protocols donot adequately test long-term module performance. This paper describes the initial development of an accelerated testing methodology utilizing various applied stresses. The results of more than 2 years of indoor testing indicate that stable CdS/CdTe modules can be produced.

U2 - 10.1109/PVSC.1996.564245

DO - 10.1109/PVSC.1996.564245

M3 - Paper

SP - 785

EP - 788

T2 - Twenty Fifth IEEE Photovoltaic Specialists Conference

Y2 - 13 May 1996 through 17 May 1996

ER -

Stability Testing of CdTe/CdS Thin-Film Photovoltaic Modules

Abstract

Conference

Bibliographical note

NREL Publication Number

Access to Document

Fingerprint

Cite this