TY - GEN
T1 - Statistical Modeling of Photovoltaic Reliability Using Accelerated Degradation Techniques (Poster)
AU - NREL, null
PY - 2011
Y1 - 2011
N2 - We introduce a cutting-edge life-testing technique, accelerated degradation testing (ADT), for PV reliability testing. The ADT technique is a cost-effective and flexible reliability testing method with multiple (MADT) and Step-Stress (SSADT) variants. In an environment with limited resources, including equipment (chambers), test units, and testing time, these techniques can provide statisticallyrigorous prediction of lifetime and other interesting parameters, such as failure rate, warranty time, mean time to failure, degradation rate, activation energy, acceleration factor, and upper limit level of stress. J-V characterization can be used for degradation data and the generalized Eyring model can be used for the thermal-humidity stress condition. The SSADT model can be constructed basedon the cumulative damage model (CEM), which assumes that the remaining test united are failed according to cumulative density function of current stress level regardless of the history on previous stress levels.
AB - We introduce a cutting-edge life-testing technique, accelerated degradation testing (ADT), for PV reliability testing. The ADT technique is a cost-effective and flexible reliability testing method with multiple (MADT) and Step-Stress (SSADT) variants. In an environment with limited resources, including equipment (chambers), test units, and testing time, these techniques can provide statisticallyrigorous prediction of lifetime and other interesting parameters, such as failure rate, warranty time, mean time to failure, degradation rate, activation energy, acceleration factor, and upper limit level of stress. J-V characterization can be used for degradation data and the generalized Eyring model can be used for the thermal-humidity stress condition. The SSADT model can be constructed basedon the cumulative damage model (CEM), which assumes that the remaining test united are failed according to cumulative density function of current stress level regardless of the history on previous stress levels.
KW - accelerated degradation testing
KW - reliability
KW - step-stress
M3 - Poster
T3 - Presented at the 2011 PV Module Reliability Workshop, 16-17 February 2011, Golden, Colorado
ER -