Statistical Modeling of Photovoltaic Reliability Using Accelerated Degradation Techniques (Poster)

Research output: NRELPoster


We introduce a cutting-edge life-testing technique, accelerated degradation testing (ADT), for PV reliability testing. The ADT technique is a cost-effective and flexible reliability testing method with multiple (MADT) and Step-Stress (SSADT) variants. In an environment with limited resources, including equipment (chambers), test units, and testing time, these techniques can provide statisticallyrigorous prediction of lifetime and other interesting parameters, such as failure rate, warranty time, mean time to failure, degradation rate, activation energy, acceleration factor, and upper limit level of stress. J-V characterization can be used for degradation data and the generalized Eyring model can be used for the thermal-humidity stress condition. The SSADT model can be constructed basedon the cumulative damage model (CEM), which assumes that the remaining test united are failed according to cumulative density function of current stress level regardless of the history on previous stress levels.
Original languageAmerican English
StatePublished - 2011

Publication series

NamePresented at the 2011 PV Module Reliability Workshop, 16-17 February 2011, Golden, Colorado

NREL Publication Number

  • NREL/PO-2C00-50738


  • accelerated degradation testing
  • reliability
  • step-stress


Dive into the research topics of 'Statistical Modeling of Photovoltaic Reliability Using Accelerated Degradation Techniques (Poster)'. Together they form a unique fingerprint.

Cite this