Step-Stress Accelerated Degradation Testing (SSADT) for Photovoltaic (PV) Devices and Cells (Presentation)

Devonie McCamey

Research output: NRELPresentation

Abstract

Presentation on step-stress accelerated degradation testing (SSADT) for photovoltaics (PV). Developed are a step-stress degradation test (SSADT) for PV reliability tests and a lifetime prediction model for PV products.
Original languageAmerican English
Number of pages15
StatePublished - 2010

Publication series

NamePresented at the 2010 Workshop on Accelerated Stress Testing & Reliability, 6-8 October 2010, Denver, Colorado

NREL Publication Number

  • NREL/PR-2C00-49487

Keywords

  • photovoltaics (PV)
  • reliability testing
  • SSADT
  • step-stress accelerated degradation test (SSADT)

Fingerprint

Dive into the research topics of 'Step-Stress Accelerated Degradation Testing (SSADT) for Photovoltaic (PV) Devices and Cells (Presentation)'. Together they form a unique fingerprint.

Cite this