Abstract
This paper contains a few representative results of a scanning tunneling microscope (STM) survey of Ge surfaces after exposure to arsenic and phosphorous.
Original language | American English |
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Pages | 121-122 |
Number of pages | 2 |
State | Published - 2000 |
Event | Program and NCPV Program Review Meeting 2000 - Denver, Colorado Duration: 16 Apr 2000 → 19 Apr 2000 |
Conference
Conference | Program and NCPV Program Review Meeting 2000 |
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City | Denver, Colorado |
Period | 16/04/00 → 19/04/00 |
NREL Publication Number
- NREL/CP-520-28276
Keywords
- amorphous Si
- applications
- cadmium telluride (CdTe) photovoltaic solar cells modules
- components
- concentrators
- copper indium diselenide (CIS)
- crystalline silicon (x-Si) (c-Si)
- manufacturing
- markets
- NCPV
- photovoltaics (PV)
- research and development (R&D)
- systems
- systems integration
- thin films