STM Survey of As/Ge(mnn) and P/Ge(mnn) Surfaces

    Research output: Contribution to conferencePaper


    This paper contains a few representative results of a scanning tunneling microscope (STM) survey of Ge surfaces after exposure to arsenic and phosphorous.
    Original languageAmerican English
    Number of pages2
    StatePublished - 2000
    EventProgram and NCPV Program Review Meeting 2000 - Denver, Colorado
    Duration: 16 Apr 200019 Apr 2000


    ConferenceProgram and NCPV Program Review Meeting 2000
    CityDenver, Colorado

    NREL Publication Number

    • NREL/CP-520-28276


    • amorphous Si
    • applications
    • cadmium telluride (CdTe) photovoltaic solar cells modules
    • components
    • concentrators
    • copper indium diselenide (CIS)
    • crystalline silicon (x-Si) (c-Si)
    • manufacturing
    • markets
    • NCPV
    • photovoltaics (PV)
    • research and development (R&D)
    • systems
    • systems integration
    • thin films


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