Abstract
This study demonstrates that the method of encapsulation can affect the long-term stability of CIGS modules, principally through interactions with the ZnO.
| Original language | American English |
|---|---|
| Number of pages | 9 |
| State | Published - 2008 |
| Event | 33rd IEEE Photovoltaic Specialists Conference - San Diego, California Duration: 11 May 2008 → 16 May 2008 |
Conference
| Conference | 33rd IEEE Photovoltaic Specialists Conference |
|---|---|
| City | San Diego, California |
| Period | 11/05/08 → 16/05/08 |
NREL Publication Number
- NREL/CP-520-43302
Keywords
- diodes
- modules
- monolithically integrated copper
- PV
- solar cells
- stress testing
- thin films
- transparent conducting oxides (TCO)