Stress Induced Degradation Modes in CIGS Mini-Modules: Preprint

Research output: Contribution to conferencePaper


This study demonstrates that the method of encapsulation can affect the long-term stability of CIGS modules, principally through interactions with the ZnO.
Original languageAmerican English
Number of pages9
StatePublished - 2008
Event33rd IEEE Photovoltaic Specialists Conference - San Diego, California
Duration: 11 May 200816 May 2008


Conference33rd IEEE Photovoltaic Specialists Conference
CitySan Diego, California

NREL Publication Number

  • NREL/CP-520-43302


  • diodes
  • modules
  • monolithically integrated copper
  • PV
  • solar cells
  • stress testing
  • thin films
  • transparent conducting oxides (TCO)


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